Back Issues

JUL/AUG 2013  

Follow us:

Find MICROmanufacturing on TwitterFind MICROmanufacturing on FacebookFind MICROmanufacturing on YouTubeMICROmanufacturing RSS feed

Phenom-World launches Element Identification software v3.0

Company

Phenom-World

31 (0)40 259 7360

Phenom-World has launched its Element Identification (EID) software v3.0. With the Phenom proX desktop scanning electron microscope sample structures can be physically examined and their elemental composition determined, according to the company.

The EID software package included in the system allows users to identify any hidden elements within any sample and optionally reveal the distribution of the elements with elemental mapping features, the company reports.

The Eindhoven, Netherlands-based supplier of desktop scanning electron microscopes offers its integrated Element Identification software package with a comprehensive Elemental Mapping and Line Scan option.

The most popular of its offerings is the Phenom proX, according to the company. The advanced system identifies different elements in a specimen by using the integrated EID software and specially designed EDS detector.

EID_Selected_Area_Mapping

Phenom-World's new Element Identification software v3.0 offers elemental mapping features.

The EID technique analyzes X-rays generated in the specimen by the bombardment of electrons from an advanced CeB6 electron source. The EID software package is fully integrated, so there is no need to switch between software packages or computers. The software allows users to identify any hidden elements within a sample via the point-and-shoot functionality. Additionally, the software can be expanded with a combined Elemental Mapping and Line Scan option.

Elemental Mapping reveals the distribution of elements within the sample. The selected elements can be mapped at a user-specified pixel resolution and acquisition time. Elements can be added or removed at any time during or after the mapping process. Mapping can be done on the image as a whole, but there is an additional benefit included to save time by adding the Selected Area option. Line Scan allows analysis over a selected line. The key lies in the possibility to select each of the following: number of points, dwell time per point and number of passes. Also, the results can be easily exported and reported via an automated template, according to the company.

The Phenom proX desktop SEM is offered as a complete package: imaging module with EDX detector, 19" touch screen monitor, rotary knob, mouse, diaphragm vacuum pump, power supply, USB flash drive, Pro Suite 19" monitor, mini-PC, keyboard, pre-installed Pro Suite software and the applications Remote UI and Element Identification.